Visiting Assistant Professor of Physics
Dr. Poudel is a Visiting Assistant Professor of Physics in the Department of Physics and Technology. He teaches courses ranging from introductory physics to advanced topics, emphasizing active learning, hands-on activities and collaborative problem-solving. His teaching approach helps students connect theoretical concepts with real-world applications, fostering both understanding and curiosity. Dr. Poudel has several years of teaching experience at both the undergraduate and graduate levels, which has strengthened his ability to present complex topics in clear and engaging ways for diverse groups of learners.
His research focuses on the design and fabrication of nanoscale devices, developing complex instrumentation for precision electronic measurements. He also employs scanning probe microscopy and other advanced techniques to explore the electronic and structural properties of two-dimensional materials, including graphene and other van der Waals materials, as well as semiconductor heterostructures. By combining careful experimental design with detailed data analysis, his work contributes to a deeper understanding of quantum phenomena in two-dimensional electron system (2DES) and explores potential applications in next-generation electronic devices.
Dr. Poudel takes pride in mentoring students in research, working alongside them as they design experiments, tackle challenges and analyze results. He encourages curiosity, creativity and hands-on learning, helping students build confidence and skills that prepare them for both academic and career success.
Education
- Ph.D. Physics, Georgia State University
- M.S. Physics, Georgia State University
- M.S. Physics, Tribhuvan University
- B.S. Physics, Tribhuvan University
Teaching Interests
- General Physics
- Modern Physics
- Electronics
- Electrodynamics
- Instrumentation
Research Interests
- Semiconductor devices
- Nanoscale device fabrication
- Magneto-transport study of 2DES
- Cryogenic
- Microwave and UHV techniques
- Scanning probe microscopy (SPM)